Incompatibilities discovered during immunity tests according to EN 1000-4-4 (burst) and EN 1000-4-2 (ESD), generally can only be eliminated with a greater expense of filters and shielding material.
A new, cost-saving way is the application of field sources.
It becomes possible to locate the weak point responsible for the incompatibility with special generators and probes (field sources). Such a weak point can consist of one individual conducting path in a complete device.
Why equip the entire device with expensive shielding and filtering just for one conducting path?
It is sufficient to detect the critical conducting path section and eliminate the weak point with a targeted layout change.
AFJ offer an immunity test line to reduce development and production costs.
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